Atomic-force microscopy

Results: 458



#Item
421Nanotechnology / Engines / Nanogenerator / Condensed matter physics / Zinc oxide / Atomic force microscopy / Piezoelectricity / Threshold voltage / Nanowire / Chemistry / Materials science / Microtechnology

Subscriber access provided by Georgia Tech Library Letter

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Source URL: www.nanoscience.gatech.edu

Language: English - Date: 2009-03-11 14:23:01
422Vacuum energy / Vacuum / Atomic force microscopy / Electron / Energy density / Quantum electrodynamics / Force / Van der Waals force / Electric field / Physics / Quantum field theory / Casimir effect

Published as: AIAA/ASME/SAE/ASEE 37th Joint Propulsion Conference, Salt Lake City, July 8, 2001, Paper # AIAA[removed], "Measurement of Repulsive Vacuum Forces"

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Source URL: www.quantumfields.com

Language: English - Date: 2001-10-21 19:33:43
423Microscopes / Intermolecular forces / Scanning tunneling microscope / Chemistry / Atomic force microscopy / Scanning tunneling spectroscopy / Scanning probe microscopy / Scientific method / Science

Subatomic Features on the Silicon[removed]×7) Surface Observed by Atomic Force Microscopy Franz J. Giessibl, et al.

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Source URL: www-inst.eecs.berkeley.edu

Language: English - Date: 2008-05-05 18:07:04
424Intermolecular forces / Atomic force microscopy / Chemistry / Microscope / Veeco / Scanning probe microscopy / Scientific method / Science

PeakForce Tapping Mode AFM and Quantitative Nanomechanical Measurements Chunzeng Li on behalf of Veeco Team and Collaborators

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Source URL: mse.ustb.edu.cn

Language: English - Date: 2010-08-30 22:20:01
425Microbiology / Science / Virology / Tobacco mosaic virus / Retrovirus / Cowpea chlorotic mottle virus / Plant virus / Atomic force microscopy / Kobuvirus / Biology / Viruses / Molecular biology

Journal of General Virology (2001), 82, 2025–2034. Printed in Great Britain ...................................................................................................................................................................................................................................................................................

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Source URL: vir.sgmjournals.org

Language: English - Date: 2001-08-14 17:36:22
426Swiss Nanoscience Institute / Physics / Materials science / Christoph Gerber / Gerd Binnig / Atomic force microscopy / Scanning tunneling microscope / Basel / Nanoparticle / Science / Scanning probe microscopy / Nanotechnology

SNI update October 2011 Words from the Editor Dear colleagues

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Source URL: www.nanoscience.ch

Language: English - Date: 2012-01-15 08:28:50
427Scientific method / Nanotechnology / Spectroscopy / Intermolecular forces / Microscopy / Atomic force microscopy / AFM probe / Force spectroscopy / Cantilever / Science / Chemistry / Scanning probe microscopy

Chemical Functionalization of AFM Cantilevers by Sunyoung Lee

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Source URL: dspace.mit.edu

Language: English - Date: 2008-03-11 01:04:12
428Chemistry / Atomic force microscopy / Local oxidation nanolithography / NanoWorld / AFM probe / Scanning tunneling microscope / Microscopy / Nanotechnology / Optical microscope / Scanning probe microscopy / Science / Materials science

RESEARCH NEWS Nanomanipulation by Atomic Force

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Source URL: www.nano-science.de

Language: English - Date: 2006-01-11 10:36:52
429Scanning probe microscopy / Microtechnology / Bioengineering / Tissue engineering / Nanolithography / Dip-pen nanolithography / Scanning probe lithography / Self-assembled monolayer / Atomic force microscopy / Materials science / Nanotechnology / Chemistry

Reviews U. S. Schubert and D. Wouters

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Source URL: www.schubert-group.de

Language: English - Date: 2010-06-10 06:46:10
430Scientific method / Scanning tunneling microscope / Atomic force microscopy / Microscope / Magnetic force microscope / Scanning tunneling spectroscopy / Optical microscope / Near-field scanning optical microscope / Electron microscope / Scanning probe microscopy / Science / Microscopy

A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY Authors (first edition) :

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Source URL: web.mit.edu

Language: English - Date: 2003-03-11 15:49:37
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